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Title: Process research on polycrystalline silicon material. Final technical report

Technical Report ·
DOI:https://doi.org/10.2172/7147170· OSTI ID:7147170

The performance-limiting mechanism in large-grain polycrystalline silicon solar cells were investigated by fabricating a matrix of 4 cm/sup 2/ solar cells of various thicknesses from 10 cm x 10 cm polycrystalline silicon wafers of several bulk resistivities. The analysis of the illuminated I-V characteristics of the cells of this thickness-resistivity matrix strongly suggest that bulk recombination is the dominant factor limiting the short-circuit current in large-grain polycrystalline silicon, the same mechanism that limits the short-circuit current in single-crystal silicon. Further investigation of the performance-limiting mechanisms consisted of fabricating a set of mini-cell wafers from a selection of 10 cm x 10 cm polycrystalline silicon wafers. A mini-cell wafer contains an array of small (approximately 0.2 cm/sup 2/ in area) photodiodes that are isolated from one another by a mesa structure. The average short-circuit current on different wafers was 3 to 14% lower than that of single-crystal Czochralski silicon. The average open-circuit voltage was 20 to 60 mV less than that of single-crystal silicon. The fill-factor of both polycrystalline and single-crystal silicon cells was equivalent. Lower average values of open-circuit voltage and a greater degree of open-circuit voltage and fill-factor scatter were correlated with the presence of inclusions, which was also correlated with significantly greater values of shunt conductance. Measurement of the dark I-V characteristics of mini-cells from several wafers with few inclusions indicates that spatial variations in quasi-neutral recombination current are the dominant cause of open-circuit voltage variations. A damage-gettering heat-treatment was investigated and was found to improve the minority-carrier diffusion length in low lifetime polycrystalline silicon. However, extended high temperature heat-treatment did not further improve, but rather degraded, the lifetime.

Research Organization:
Solarex Corp., Rockville, MD (USA)
DOE Contract Number:
NAS-7-100-955902
OSTI ID:
7147170
Report Number(s):
DOE/JPL/955902-83/11; ON: DE84011716
Resource Relation:
Other Information: Portions are illegible in microfiche products. Original copy available until stock is exhausted
Country of Publication:
United States
Language:
English