Flash x-ray measurements with a time projection Compton spectrometer

Conference · Mon Jan 01 00:00:00 EST 1990

DOI:https://doi.org/10.1016/0168-9002(90)90749-V· OSTI ID:6971701

Baldwin, G T; Landron, C O; Lee, J R; Leeper, R J; Lorence, Jr, L J

We have developed a Time Projection Compton Spectrometer'' (TPCS) to measure the time-integrated photon energy spectrum between 0.1 and 2 MeV of short-pulse, intense bremsstrahlung sources. A target in the TPCS produces Compton electrons when illuminated by the flash X-ray source. Target electrons are trapped magnetically by current in a rod on the axis of an evacuated drift tube. The curvature and gradient of magnetic field cause the electrons to drift parallel to the spectrometer axis. Time of electron arrival at the end of a 1-m drift encodes the energy spectrum of the X-ray burst. The detector is a plastic scintillator coupled to a fast photomultiplier tube. Despite heavy shielding, enough prompt X-rays penetrate to give a time fiducial. Background is measured on shots with the X-ray target removed. The response of the TPCS is calculated using the TIGERP computer code to model photon/electron transport in the target and a sophisticated algorithm to compute electron drift velocity. The response functions and signal are the known components of a matrix equation, which is solved to determine the unknown spectrum. We tested the TPCS with flash X-ray sources on the Saturn accelerator. Signals have been analyzed, spectra unfolded, and results compared with other methods. 14 refs., 12 figs.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: DOE/DP
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 6971701
• Report Number(s): SAND-90-0164C; CONF-900563-5; ON: DE90011050
• Resource Relation: Journal Volume: 299; Journal Issue: 1-3; Conference: 7. symposium on radiation measurements and applications, Ann Arbor, MI (USA), 21-24 May 1990
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
43 PARTICLE ACCELERATORS
COMPTON SPECTROMETERS
DESIGN
X-RAY SOURCES
X-RAY SPECTRA
BREMSSTRAHLUNG
EXPERIMENTAL DATA
PLASTIC SCINTILLATION DETECTORS
SHIELDING
DATA
ELECTROMAGNETIC RADIATION
EQUIPMENT
GAMMA SPECTROMETERS
INFORMATION
MEASURING INSTRUMENTS
NUMERICAL DATA
RADIATION DETECTORS
RADIATION SOURCES
RADIATIONS
SCINTILLATION COUNTERS
SOLID SCINTILLATION DETECTORS
SPECTRA
SPECTROMETERS
X-RAY EQUIPMENT
440800* - Miscellaneous Instrumentation- (1990-)
430300 - Particle Accelerators- Auxiliaries & Components