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Title: Structural and electronic studies of defects in amorphous silicon. Technical progress report, September-November, 1980

Technical Report ·
DOI:https://doi.org/10.2172/6721641· OSTI ID:6721641

Separate abstracts were prepared for the two sections included. (WHK)

Research Organization:
Xerox Palo Alto Research Center, CA (USA)
DOE Contract Number:
AC02-77CH00178
OSTI ID:
6721641
Report Number(s):
SERI/PR-9079-1-T3
Country of Publication:
United States
Language:
English