skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Photoconductivity measurements of x-ray absorption fine structures in liquids in the soft x-ray region: Si and Cl K-edge

Conference ·
OSTI ID:6715847
; ;  [1];  [2];  [3]
  1. University of Western Ontario, London, ON (Canada). Dept. of Chemistry
  2. Brookhaven National Lab., Upton, NY (United States)
  3. Chicago Univ., IL (United States)

Photoconductivity measurements of X-ray absorption fine structures (XAFS) at the Si and Cl K-edge have been carried out in a liquid cell for (CH[sub 3])[sub 4],Si [(CH[sub 3])[sub 3]Si][sub 4]Si and eitheras a pure liquid or 2,2,4-trimethylpentane solution. It is found that for the pure liquids and their concentrated hydrocarbon solutions, all K-edge XAFS spectra are inverted as expected under the condition of total absorption. A sharp conductivity dip is also observed in CCl[sub 4] at the Cl K-edge. The concentration dependence of the XAFS spectrum of CCl[sub 4] is reported. These results are discussed in terms of soft X-ray induced ion yields of the solute and solvent molecules in liquids.

Research Organization:
Brookhaven National Lab., Upton, NY (United States)
Sponsoring Organization:
USDOE; National Science Foundation (NSF); CANSERC; ONCMR; USDOE, Washington, DC (United States); National Science Foundation, Washington, DC (United States); Natural Sciences and Engineering Research Council of Canada, Ottawa, ON (Canada); Ontario Centre for Materials Research, Kingston, ON (Canada)
DOE Contract Number:
AC02-76CH00016
OSTI ID:
6715847
Report Number(s):
BNL-48487; CONF-9208160-6; ON: DE93006670
Resource Relation:
Conference: 7. international conference on x-ray absorption fine structure, Kobe (Japan), 23-29 Aug 1992
Country of Publication:
United States
Language:
English