Experimental characterization of the flux-line lattice in superconducting V/sub 3/Si

Conference · Fri Jan 01 00:00:00 EST 1982

OSTI ID:6464480

Christen, D K; Kerchner, H R; Narayan, J; Chang, Y K; Larson, B C; Sekula, S T

Several microscopic properties of the flux-line lattice (FLL) in three separate single crystals of V/sub 3/Si have been investigated by means of small-angle neutron diffraction. These low-field FLL characterizations have been correlated with the following material and superconducting properties: (1) the real crystal symmetry parallel to the applied magnetic field; (2) the micro-structure as determined by TEM; (3) magnetic irreversibilities in the mixed state; (4) reversible flux-line motion in ac response; and (5) martensitic structural transformation observed by x-ray diffraction. The three samples, V/sub 3/Si-MP3, -MP4, and -MP5 possessed different defect structures, and this was manifested foremost in the FLL perfection. At low field (B<0.2 T) and T=4.85/sup 0/K, only MP3, which is free of second-phase precipitates, showed a highly resolved FLL. Sample MP5 contains a low density of small (200 A) coherent precipitates, and revealed well-defined FLL Bragg peaks for B greater than or equal to 0.5 T, but a highly mosaic, nearly polycrystalline FLL at lower fields. Sample MP4 contained large (500 to 1000 A) incoherent precipitates, and showed only a polycrystalline FLL at low field. In both MP3 and MP5, distinct anisotropic correlations were observed between the FLL morphology and the real-crystal direction along the applied field. The FLL perfection was strongly dependent on the growth history. The peak width history dependence for two different scattering geometries can be qualitatively modeled by proposed flux-pinning mechanisms. Quantitative comparisons with critical current measurements, however, are not totally reconcilable.

• Research Organization: Oak Ridge National Lab., TN (USA)
• DOE Contract Number: W-7405-ENG-26
• OSTI ID: 6464480
• Report Number(s): CONF-821108-12; ON: DE83004647
• Resource Relation: Conference: Applied superconductivity conference, Knoxville, TN, USA, 30 Nov 1982; Other Information: Portions are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
SILICON ALLOYS
MICROSTRUCTURE
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VANADIUM ALLOYS
CRYSTAL DEFECTS
MAGNETIC PROPERTIES
MONOCRYSTALS
NEUTRON DIFFRACTION
SMALL ANGLE SCATTERING
SUPERCONDUCTORS
ALLOYS
COHERENT SCATTERING
CRYSTAL STRUCTURE
CRYSTALS
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ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
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