Postcollision interactions in the Auger decay of the Ar L-shell
- Univ. of Nebraska, Lincoln, NE (United States); and others
The photoionization cross sections for Ar{sup +} through Ar{sup 4+}, produced by the Auger decay of an inner shell 2p hole, have been measured between 242 eV and 253 eV on beamline 9.0.1 and 6.3.2. In this study the authors are interested in near threshold phenomenon involving postcollision interactions (PCI), which are related to the Auger decay of a vacancy in the Ar L-shell. During an Auger decay a postcollision interaction can occur causing the out-going photoelectron to be retarded thus losing a certain amount of energy. If the retardation is sufficiently large the photoelectron will not escape. This result produces a singly charged ion, which normally would not be present. Such evidence of electron capture by the PCI effect was first shown clearly by Eberhardt et al. and, with higher resolution, in the present work. However, capture of the photoelectron is expected to be 100% exactly at the L{sub 2,3} thresholds. Thus, from the authors results they would have expected the Ar{sup 2+} signal to be zero at threshold, but it was not? The authors can explain this anomoly on the basis that during the Auger decay the photoelectrons are captured into high lying excited states of Ar{sup +}, which subsequently decay through autoionization yielding Ar{sup 2+}. Future work in this area will seek experimental evidence to verify this prediction.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- OSTI ID:
- 603480
- Report Number(s):
- LBNL-39981; ON: DE97007345; CNN: Grant PHY-9410716; TRN: 98:009510
- Resource Relation:
- Other Information: PBD: Apr 1997; Related Information: Is Part Of Advanced light source: Compendium of user abstracts 1993--1996; PB: 622 p.
- Country of Publication:
- United States
- Language:
- English
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