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Title: Thermal damage study of beryllium windows used as vacuum barriers in synchrotron radiation beamlines

Technical Report ·
DOI:https://doi.org/10.2172/5894782· OSTI ID:5894782

An experimental study to investigate thermal-induced damage to SSRL-designed beryllium foil windows was performed at LLNL's Laser Welding Research Facility. The primary goal of this study was to determine the threshold at which thermal-stress-induced damage occurs in these commonly used vacuum barriers. An Nd:Yag pulsed laser with cylindrical optics and a carefully designed test cell provided a test environment that closely resembles the actual beamline conditions at SSRL. Tests performed on two beryllium window geometries, with different vertical aperture dimensions but equal foil thicknesses of 0.254 mm, resulted in two focused total-power thresholds at which incipient damage was determined. For a beam spot size similar to that of the Beamline-X Wiggler Line, onset of surface damage for a 5-mm by 25-mm aperture window was observed at 170 W after 174,000 laser pulses (1.2-ms pulse at 100 pps). A second window with double the vertical aperture dimension (10 mm by 25 mm) was observed to have surface cracking after 180,000 laser pulses with 85 W impinging its front surface. It failed after approximately 1,000,000 pulses. Another window of the same type (10 mm by 25 mm) received 2,160,000 laser pulses at 74.4 W, and subsequent metallographic sectioning revealed no signs of through-thickness damage. Comparison of windows with equal foil thicknesses and aperture dimensions has effectively identified the heat flux limit for incipient failure. The data show that halving the aperture's vertical dimension allows doubling the total incident power for equivalent onsets of thermal-induced damage.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
5894782
Report Number(s):
UCID-21179; ON: DE88002655
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products. Original copy available until stock is exhausted
Country of Publication:
United States
Language:
English