One-frequency laser interferometer using the optic fiber as a polarization-independent interference phase detector

Technical Report · Fri Feb 01 00:00:00 EST 1985

DOI:https://doi.org/10.2172/5780527· OSTI ID:5780527

Shu, D

A soft x-ray scanning microscope will be built on the NSLS x-ray ring's undulator beam line. It is expected that the beam line will provide more powerful coherent soft x-ray flux to improve the resolution of scanning microscopy to the sub-1000A range and form pictures in seconds rather than minutes. A laser interferometer has been developed for encoding the coordinates of the scanning plane of the soft x-ray microscope with 300A resolution. A pair of the optical fibers has been used as an interference fringe phase detector in the interferometer which can make the system phase adjustment simpler, more accurate, and polarization-independent. The last character is important because if the fringe phase detector is polarization dependent the interferometer's optical design will be complicated when the optical path of the interferometer has to include additional windows or mirrors which usually change the polarization situation. In the first section of this report we discuss the optical arrangement of the interferometer. In the following two sections we describe the schematic of the resolution extending unit and the interferometer's other possible applications.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5780527
• Report Number(s): BNL-36088; ON: DE85010544
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
47 OTHER INSTRUMENTATION
MICROSCOPES
ALIGNMENT
INTERFEROMETERS
NSLS
FIBER OPTICS
LASER RADIATION
RESOLUTION
SOFT X RADIATION
X-RAY SOURCES
ACCELERATORS
CYCLIC ACCELERATORS
ELECTROMAGNETIC RADIATION
EQUIPMENT
IONIZING RADIATIONS
MEASURING INSTRUMENTS
RADIATION SOURCES
RADIATIONS
SYNCHROTRON RADIATION SOURCES
SYNCHROTRONS
X RADIATION
X-RAY EQUIPMENT
430303* - Particle Accelerators- Experimental Facilities & Equipment
440300 - Miscellaneous Instruments- (-1989)