Electrical properties of neutron-transmutation-doped germanium
Electrical properties of neutron-transmutation-doped germanium (NTD Ge) and nearly uncompensated gallium-doped germanium have been measured as functions of net-impurity concentration (2 x 10/sup 15/cm/sup -3/ less than or equal to N/sub A/ - N/sub D/ less than or equal to 5 x 10/sup 16/cm/sup -3/) and temperature (0.3 K less than or equal to T less than or equal to 300 K). The method of impurity conduction as a function of carrier concentration and compensation was investigated in the low temperature hopping regime. For nearest neighbor hopping, the resistivity is expected to vary as rho = rho/sub 0/exp(..delta../T) while Mott's theory of variable range hopping predicts that rho = rho/sub 0/exp(..delta../T)/sup 1/4/ in the low temperature limit. In contrast, our results show that the resistivity can best be approximated by rho = rho/sub 0/exp(..delta../T)/sup 1/2/ in the hopping regime down to 0.3 K.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5770973
- Report Number(s):
- LBL-16216; ON: DE83016693
- Resource Relation:
- Other Information: Thesis
- Country of Publication:
- United States
- Language:
- English
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PHYSICAL RADIATION EFFECTS
ACTIVATION ENERGY
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EXPERIMENTAL DATA
HALL EFFECT
NEUTRONS
PURIFICATION
TEMPERATURE DEPENDENCE
TRANSMUTATION
BARYONS
DATA
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360605* - Materials- Radiation Effects