ARPEFS as an analytic technique
Two modifications to the ARPEFS technique are introduced. These are studied using p(2 {times} 2)S/Cu(001) as a model system. The first modification is the obtaining of ARPEFS {chi}(k) curves at temperatures as low as our equipment will permit. While adding to the difficulty of the experiment, this modification is shown to almost double the signal-to-noise ratio of normal emission p(2 {times} 2)S/Cu(001) {chi}(k) curves. This is shown by visual comparison of the raw data and by the improved precision of the extracted structural parameters. The second change is the replacement of manual fitting of the Fourier filtered {chi}(k) curves by the use of the simplex algorithm for parameter determination. Again using p(2 {times} 2)S/Cu(001) data, this is shown to result in better agreement between experimental {chi}(k) curves and curves calculated based on model structures. The improved ARPEFS is then applied to p(2 {times} 2)S/Ni(111) and ({radical}3 {times} {radical}3) R30{degree}S/Ni(111). For p(2 {times} 2)S/Cu(001) we find a S-Cu bond length of 2.26 {Angstrom}, with the S adatom 1.31 {Angstrom} above the fourfold hollow site. The second Cu layer appears to be corrugated. Analysis of the p(2 {times} 2)S/Ni(111) data indicates that the S adatom adatom adsorbs onto the FCC threefold hollow site 1.53 {Angstrom} above the Ni surface. The S-Ni bond length is determined to be 2.13 {Angstrom}, indicating an outwards shift of the first layer Ni atoms. We are unable to assign a unique structure to ({radical}3 {times} {radical}3)R30{degree}S/Ni(111). An analysis of the strengths and weaknesses of ARPEFS as an experimental and analytic technique is presented, along with a summary of problems still to be addressed.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE; USDOE, Washington, DC (USA)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 5729007
- Report Number(s):
- LBL-30769; ON: DE91014237
- Resource Relation:
- Other Information: Thesis (Ph.D.)
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
CRYSTAL STRUCTURE
PHOTOELECTRON SPECTROSCOPY
COPPER
ELECTRON DIFFRACTION
GOLD
MEASURING METHODS
MODIFICATIONS
NICKEL
PHOTOEMISSION
SCATTERING
SURFACES
COHERENT SCATTERING
DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
METALS
SECONDARY EMISSION
SPECTROSCOPY
TRANSITION ELEMENTS
656002* - Condensed Matter Physics- General Techniques in Condensed Matter- (1987-)
360104 - Metals & Alloys- Physical Properties