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Title: Development of Nomarski microscopy for quantitative determination of surface topography

Conference ·
OSTI ID:5710073

The use of Nomarski differential interference contrast (DIC) microscopy has been extended to provide nondestructive, quantitative analysis of a sample's surface topography. Theoretical modeling has determined the dependence of the image intensity on the microscope's optical components, the sample's optical properties, and the sample's surface orientation relative to the microscope. Results include expressions to allow the inversion of image intensity data to determine sample surface slopes. A commercial Nomarski system has been modified and characterized to allow the evaluation of the optical model. Data have been recorded with smooth, planar samples that verify the theoretical predictions.

Research Organization:
Battelle Pacific Northwest Labs., Richland, WA (USA)
DOE Contract Number:
EY-76-C-06-1830
OSTI ID:
5710073
Report Number(s):
PNL-SA-7718; CONF-790838-3
Resource Relation:
Conference: 23. annual international symposium of the Society of Photographic Instrumentation Engineers, San Diego, CA, USA, 27 Aug 1979
Country of Publication:
United States
Language:
English