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Title: Review of electron impact excitation cross sections for copper atom

Technical Report ·
DOI:https://doi.org/10.2172/5526164· OSTI ID:5526164

Excitation of atomic copper by electron impact plays an important role in the copper vapor laser and accurate cross sections are needed for understanding and modeling laser performance. During the past seven years, there have been several attempts to normalize the relative elastic and inelastic cross sections measured by Trajmar and coworkers. However, each of these efforts have yielded different cross sections, and the uncertainty in the correct normalization of the data has been a source of confusion and concern for the kinetic modeling efforts. This difficulty has motivated us to review previous work on the electron impact excitation of copper atom and to perform new calculations of the inelastic cross sections using the impact parameter method. In this memorandum we review the previous attempts to normalize the experimental data and provide a critical assessment of the accuracy of the resulting cross sections. We also present new theoretical cross sections for the electron impact excitation of the /sup 2/S ..-->.. /sup 2/P/sup 0/ and /sup 2/S ..-->.. /sup 2/D transitions in copper. When the experimental cross sections are renormalized to the results of the impact parameter calculations, they are a factor of three smaller than those published in the latest paper of Trajmar et. al. At impact energies above 60 eV the excitation cross sections obtained with the impact parameter method agree well with the results of the very recent, unpublished, close-coupling calculations of Henry. This agreement suggests that the present normalization of the experimental cross sections is probably the most reliable one obtained to date.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
5526164
Report Number(s):
UCID-19314; ON: DE82008210; TRN: 82-009206
Country of Publication:
United States
Language:
English