Metrology laboratory requirements for third-generation synchrotron radiation sources

Conference · Sat Nov 01 00:00:00 EST 1997

OSTI ID:544694

Takacs, P Z; Quian, Shinan

New third-generation synchrotron radiation sources that are now, or will soon, come on line will need to decide how to handle the testing of optical components delivered for use in their beam lines. In many cases it is desirable to establish an in-house metrology laboratory to do the work. We review the history behind the formation of the Optical Metrology Laboratory at Brookhaven National Laboratory and the rationale for its continued existence. We offer suggestions to those who may be contemplating setting up similar facilities, based on our experiences over the past two decades.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Energy Research, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 544694
• Report Number(s): BNL-64766; CONF-970706-; ON: DE98001148; TRN: 97:005797
• Resource Relation: Conference: Annual meeting of the Society of Photo-Optical Instrumentation Engineers, San Diego, CA (United States), 27 Jul - 1 Aug 1997; Other Information: PBD: 1997
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
SYNCHROTRON RADIATION SOURCES
BEAM OPTICS
MIRRORS
SURFACE PROPERTIES
MEASURING INSTRUMENTS