Analysis of individual microscopic particles by means of synchrotron radiation induced x-ray micro fluorescence

Conference · Wed Apr 01 00:00:00 EST 1992

OSTI ID:5261642

Janssens, K H; Adams, F C ^[1]; Rivers, M L ^[2]; Jones, K W ^[3]

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1. Antwerp Univ., Wilrijk (Belgium)
2. Chicago Univ., IL (United States)
3. Brookhaven National Lab., Upton, NY (United States)

Short communication.

• Research Organization: Brookhaven National Lab., Upton, NY (United States)
• Sponsoring Organization: USDOE; National Science Foundation (NSF); USDOE, Washington, DC (United States); National Science Foundation, Washington, DC (United States)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5261642
• Report Number(s): BNL-47504; CONF-920819-19; ON: DE92014692; CNN: EAR 89-15690
• Resource Relation: Conference: Annual meeting of the Electron Microscopy Society (EMS) of America, Boston, MA (United States), 16-21 Aug 1992
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
43 PARTICLE ACCELERATORS
ELECTRON MICROPROBE ANALYSIS
COMPARATIVE EVALUATIONS
X-RAY FLUORESCENCE ANALYSIS
SENSITIVITY
MICROSCOPY
MULTI-ELEMENT ANALYSIS
PARTICLES
SYNCHROTRON RADIATION
TRACE AMOUNTS
BREMSSTRAHLUNG
CHEMICAL ANALYSIS
ELECTROMAGNETIC RADIATION
EVALUATION
MICROANALYSIS
NONDESTRUCTIVE ANALYSIS
RADIATIONS
X-RAY EMISSION ANALYSIS
400102* - Chemical & Spectral Procedures
430400 - Particle Accelerators- Storage Rings