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Title: X-ray intensity interferometer for undulator radiation

Conference ·
OSTI ID:5255683
; ;  [1];  [2]
  1. Argonne National Lab., IL (United States)
  2. Lawrence Berkeley Lab., CA (United States)

Intensity interferometry is well established with visible light but has never been demonstrated with x-radiation. We propose to measure the transverse coherence of an x-ray beam, for the first time, using the method of Hanbury Brown and Twiss. The x-ray interferometer consists of an array of slits, a grazing incidence reflective beamsplitter, a pair of fast multichannel plate detectors and a broadband, low-noise correlator circuit. The NSLS X1 or X13 soft x-ray undulator will supply the partially coherent x-rays. We are developing this technique to characterize the coherence properties of x-ray beams from high brilliance insertion devices at third-generation synchrotron light facilities such as the Advanced Photon Source and the Advanced Light Source. 17 refs.

Research Organization:
Argonne National Lab., IL (United States)
Sponsoring Organization:
USDOE; USDOE, Washington, DC (United States)
DOE Contract Number:
W-31109-ENG-38; AC03-76SF00098
OSTI ID:
5255683
Report Number(s):
ANL/CP-76025; CONF-9110146-19; ON: DE92015184
Resource Relation:
Conference: 7. national conference and exhibition on synchrotron radiation instrumentation, Baton Rouge, LA (United States), 28-31 Oct 1991
Country of Publication:
United States
Language:
English