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Title: AITRAC: Augmented Interactive Transient Radiation Analysis by Computer. User's information manual

Technical Report ·
DOI:https://doi.org/10.2172/5161539· OSTI ID:5161539

AITRAC is a program designed for on-line, interactive, DC, and transient analysis of electronic circuits. The program solves linear and nonlinear simultaneous equations which characterize the mathematical models used to predict circuit response. The program features 100 external node--200 branch capability; conversional, free-format input language; built-in junction, FET, MOS, and switch models; sparse matrix algorithm with extended-precision H matrix and T vector calculations, for fast and accurate execution; linear transconductances: beta, GM, MU, ZM; accurate and fast radiation effects analysis; special interface for user-defined equations; selective control of multiple outputs; graphical outputs in wide and narrow formats; and on-line parameter modification capability. The user describes the problem by entering the circuit topology and part parameters. The program then automatically generates and solves the circuit equations, providing the user with printed or plotted output. The circuit topology and/or part values may then be changed by the user, and a new analysis, requested. Circuit descriptions may be saved on disk files for storage and later use. The program contains built-in standard models for resistors, voltage and current sources, capacitors, inductors including mutual couplings, switches, junction diodes and transistors, FETS, and MOS devices. Nonstandard models may be constructed from standard models or by using the special equations interface. Time functions may be described by straight-line segments or by sine, damped sine, and exponential functions. 42 figures, 1 table. (RWR)

Research Organization:
Berne Electronics, Inc., Albuquerque, N.Mex. (USA); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
DOE Contract Number:
EY-76-C-04-0789
OSTI ID:
5161539
Report Number(s):
SAND-77-0939; TRN: 78-006114
Country of Publication:
United States
Language:
English