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Title: Shielded transient self-interaction of a bunch entering a circle from a straight path

Technical Report ·
DOI:https://doi.org/10.2172/510403· OSTI ID:510403

Recent developments in electron-gun and injector technologies enable production of short (mm-length), high-charge (nC-regime) bunches. In this parameter regime, the curvature effect on the bunch self-interaction, by way of coherent synchrotron radiation (CSR) and space-charge forces as the beam traverses magnet bends, may cause serious emittance degradation. In this paper, the authors study an electron bunch orbiting between two infinite, parallel conducting plates. The bunch moves on a trajectory from a straight path to a circular orbit and begins radiating. Transient effects, arising from CSR and space-charge forces generated from source particles both on the bend and on the straight path prior to the bend, are analyzed using Lienard-Wiechert fields, and their overall net effect is obtained. The influence of the plates on the transients is contrasted to their shielding of the steady-state radiated power. Results for emittance degradation induced by this self-interaction are also presented.

Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
AC05-84ER40150
OSTI ID:
510403
Report Number(s):
DOE/ER/40150-1159; JLAB-ACC-97-22; ON: DE97008130; TRN: 97:014533
Resource Relation:
Other Information: PBD: [1997]
Country of Publication:
United States
Language:
English