Rocking-beam spectrum images and ALCHEMI of Ni{sub 50}Al{sub 40}Fe{sub 10}
- Oak Ridge National Lab., TN (United States). Metals and Ceramics Div.
A rocking-beam energy-dispersive X-ray (EDX) spectrum image was acquired near the [035] zone axis of a B2-ordered alloy of composition Ni{sub 50}Al{sub 40}Fe{sub 10}. Images comparable to those acquired by Rossouw et al. were formed a posteriori by integrating the X-ray intensities in windows enclosing the Al-K, Fe-K{sub {alpha}}, and Ni-K{sub {alpha}} characteristic X-ray peaks for each pixel of the spectrum image. These images are shown along with a bright-field transmission channeling pattern (TCP), which records the signal from the bright-field STEM detector as the incident beam direction is varied with the beam-tilt coils, and an EDX spectrum from one pixel of the image. The range of orientations from which the spectrum image was acquired is indicated by the square superimposed on the TCP. ALCHEMI (atom-location by channeling-enhanced microanalysis) was performed on a subset of the spectrum image using standard methods. Spectra from a series of {approximately}30 pixels along lines parallel to the (200) band were summed at each of 31 orientations relative to the band in the range 0 {le} {theta}/{theta}{sub 200} {le} 2.3. Characteristic X-ray intensities of the K-shell X-rays of Ni, Fe, and Al were extracted from the 31 summed spectra with the simplex fitting procedure of the DTSA spectral analysis software. The fraction of Fe on the `Ni`-site from this analysis, p{sub Fe`Ni`} = 23.8 {+-} 2.1%, is in excellent agreement with p{sub Fe`Ni`} = 23.7 {+-} 0.9%, which was determined by an analysis of a series of ten spectra acquired at orientations of the crystal carefully chosen so that the contributions of nonsystematic reflections are negligible.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 505351
- Report Number(s):
- CONF-970834-10; ON: DE97005257; TRN: AHC29716%%103
- Resource Relation:
- Conference: Microscopy and Microanalysis `97, Cleveland, OH (United States), 10-14 Aug 1997; Other Information: PBD: [1997]
- Country of Publication:
- United States
- Language:
- English
Similar Records
Growth and doping of Al{sub x}Ga{sub 1{minus}x}N deposited directly on {alpha}(6H)-SiC(0001) substrates via organometallic vapor phase epitaxy
ALCHEMI of NbCr{sub 2}/V C15-structured Laves phase