Thermal infrared scene simulation

Technical Report · Mon Jan 01 00:00:00 EST 1990

DOI:https://doi.org/10.2172/5035759· OSTI ID:5035759

Warnick, J. S.; Shor, E.; Schott, J. R.

The complexity and interplay between the thermodynamic and radiometric phenomena associated with longwave infrared (LWIR) images make the analyses of these images quite difficult and the development of algorithms for image analysis quite complex. This image analysis process is further complicated when the algorithms are part of a real-time targeting, tracking, or positioning system because the sensor's electro-optical system can have a significant and variable impact on the image. As a result, it is often desirable to perform evaluations of fully packaged thermal infrared imaging systems against dynamic scenes. The high cost of field testing these systems prohibits this approach in all but the research and development and early engineering stages. Even in the research and development stage the scenarios required for full system testing are often difficult to acquire. These factors have led to the search for a capability to produce a synthetically generated, self-emitting thermal infrared scene which can be dynamically updated. Sensors or algorithms exposed to this simulator could then be tested in an end-to-end (buttoned up) configuration to evaluate system performance in as close to a real world scenario as practical. One major goal of this effort was to assemble and test the performance characteristics of a system for generating dynamic self-emitting scenes. The system consisted of an argon laser source, a spatial light modulator to generate a brightness image and a two-dimensional visible-to-infrared transducer to convert the monochromatic laser energy into a broad band self-emitting thermal infrared image. 61 refs., 32 figs., 4 tabs.

• Research Organization: Rochester Inst. of Tech., NY (USA). Center for Imaging Science
• Sponsoring Organization: DOE/DP
• DOE Contract Number: FG01-88DP20153
• OSTI ID: 5035759
• Report Number(s): DOE/DP/20153-T8; RIT/DIRS-89/90-51-133; ON: DE90006900
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
INFRARED THERMOGRAPHY
IMAGE PROCESSING
ALGORITHMS
COMPARATIVE EVALUATIONS
COMPUTERIZED SIMULATION
DESIGN
FILTERS
FREQUENCY ANALYSIS
GAS LASERS
LIGHT SOURCES
PERFORMANCE TESTING
PLANCK LAW
PROGRESS REPORT
REAL TIME SYSTEMS
REMOTE SENSING
THERMODYNAMICS
TRANSDUCERS
DOCUMENT TYPES
LASERS
MATHEMATICAL LOGIC
MEASURING METHODS
PROCESSING
RADIATION SOURCES
SIMULATION
TESTING
THERMOGRAPHY
440600* - Optical Instrumentation- (1990-)
426001 - Engineering- Superconducting Devices & Circuits- (1990-)
990200 - Mathematics & Computers