JUNCTION FIELD EFFECT TRANSISTOR DEGRADATION CAUSED BY ELECTROSTATIC DISCHARGE.
- Research Organization:
- Bendix Corp., Kansas City, MO (United States)
- DOE Contract Number:
- AT(29-1)-613
- NSA Number:
- NSA-27-011561
- OSTI ID:
- 4635273
- Report Number(s):
- BDX-613-815
- Resource Relation:
- Other Information: UNCL. Orig. Receipt Date: 30-JUN-73
- Country of Publication:
- United States
- Language:
- English
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