MEASUREMENT OF THE INTENSITY OF THE PROTON BEAM OF THE HARVARD UNIVERSITY SYNCHROCYCLOTRON FOR ENERGY-SPECTRAL MEASUREMENTS OF NUCLEAR SECONDARIES
Two thin helium-filled parallel-plate ionization chambers were designed for use in continuously monitoring the 160-Mev proton beam of the Harvard University Synchrocyclotron over an intensity range from 10/sup 5/ to 10/sup 10/ protons/ sec. The ionlzation chambers were calibrated by two independert methods. In four calibrations the charge collected in the ionization chambers was compared with that deposited in a Faraday cup which followed the ionization chambers in the proton beam. In a second method, a calibration was made by individually counting beam protons with a pnir of thin scintillation detectors. The ionization chamber response was found to be flat within 2% for a five-decade range of beam intensity. Comparison of the Faraday-cup calibrations with that from proton counting shows agreement to within 5%, which is considered satisfactory. The experimental results were also in agreement, within estimated errors, with the ionization chamber response calculated using an accepted value of the average energy loss per ion pair for helium. A slow shift in the calibrations with time is ascribed to a gradual contamination of the helium of the chambers by air leakage. (auth)
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- DOE Contract Number:
- W-7405-ENG-26
- NSA Number:
- NSA-18-018507
- OSTI ID:
- 4037373
- Report Number(s):
- ORNL-3505
- Resource Relation:
- Other Information: Orig. Receipt Date: 31-DEC-64
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
AIR
CONFIGURATION
CONTAMINATION
COUNTERS
CURRENTS
CYCLOTRONS
ELECTRIC CHARGES
ELECTRONIC EQUIPMENT
ELEMENTARY PARTICLES
ENERGY
ERRORS
FARADAY CAGE
GASES
HARVARD SYNCHROCYCLOTRON
HELIUM
INTERACTIONS
IONIZATION CHAMBERS
IONS
LEAKS
LOSSES
MEASURED VALUES
MONITORING
NUMERICALS
PLANNING
PLATES
PRODUCTION
PROTON BEAMS
PROTONS
SCINTILLATION COUNTERS
SENSITIVITY
SPECTRA
STANDARDS
SYNCHROCYCLOTRONS
SYNCHROTRONS
THICKNESS
VARIATIONS