Electron transport uniformity characterization of CdZnTe using alpha particles
Novel electrode configurations, such as coplanar grids, have been successful in mitigating the effects of poor hole transport in CdZnTe gamma-ray detectors. However, poor material uniformity remains a major problem preventing the widespread application of such detectors in gamma-ray spectroscopy. Uniform electron transport is critical for achieving good gamma-ray detection performance in the coplanar-grid configuration. The authors have investigated the use of alpha-particle response as a quick and simple electron transport uniformity screening technique for material selection, and as a method to study other spectral broadening mechanisms in coplanar-grid detectors. The method consists of uniformly illuminating, with an alpha-particle source, the cathode side of the CdZnTe crystal in either a planar or a coplanar-grid detector configuration. In the planar geometry, the variation in the measured pulse heights is dictated in large part by the uniformity of the electron transport. An alpha-particle spectrum that has a single sharp peak with little background indicates uniform electron transport and, consequently, that the CdZnTe crystal should result in a coplanar-grid detector with good gamma-ray detection performance. In the coplanar geometry, the measured pulse-height variation provides information on additional sources of spectral broadening. In this paper the authors present the results of their study to measure the correlation between these simple alpha-particle measurements and the coplanar-grid gamma-ray detector response.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- Department of Defense, Washington, DC (United States)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 334368
- Report Number(s):
- LBNL-42188; CONF-980794-; ON: DE99002423; CNN: Project T-135; TRN: 99:005020
- Resource Relation:
- Conference: Hard X-ray and gamma-ray detector physics and applications conference, San Diego, CA (United States), 19-24 Jul 1998; Other Information: PBD: Apr 1998
- Country of Publication:
- United States
- Language:
- English
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