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Title: Cluster ion beam polishing for inertial confinement fusion target capsules

Conference ·
OSTI ID:305341

Targets for Inertial Confinement Fusion (ICF) typically consist of a hollow, spherical capsule filled with a mixture of hydrogen isotopes. Typically, these capsules are irradiated by short, intense pulses of either laser light (``direct drive``) or laser-generated. x-rays (``indirect drive``), causing them to implode This compresses and heats the fuel, leading to thermonuclear fusion. This process is highly sensitive to hydrodynamic (e.g., Rayleigh-Taylor) instabilities, which can be initiated by imperfections in the target. Thus, target capsules must be spherical and smooth One of the lead capsule designs for the National Ignition Facility, a 1.8 MJ laser being built at Livermore, calls for a 2-mm- diam capsule with a 150-{micro}m-thick copper-doped beryllium wall. These capsules can be fabricated by sputter depositing the metal onto a spherical plastic mandrel. This results in surfaces with measured Rq`s of 50 to 150 nm, as measured with an atomic force microscope For optimal performance the roughness should be below 10 nm rms We have begun studying the use of ion cluster beam polishing as a means of improving the surface finish of as-deposited capsules In this approach, a batch of capsules would be agitated in a bounce pan inside a vacuum chamber during exposure to the cluster beam. This would ensure a uniform beam dose around the capsule. We have performed preliminary experiments on both Be flats and on a stationary Be capsule On the capsule, the measured Rq went from 64 nm before polishing to 15 nm after This result was obtained without any effort at process optimization. Similar smoothing was observed on the planar samples

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
305341
Report Number(s):
UCRL-JC-130683; CONF-980679-; ON: DE98058695; BR: DP0210000; TRN: 99:002178
Resource Relation:
Conference: 12. international conference on ion implantation technology, Kyoto (Japan), 22-28 Jun 1998; Other Information: PBD: 9 Jun 1998
Country of Publication:
United States
Language:
English

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