Failure probability prediction of dielectric ceramics in multilayer capacitors
Dielectric ceramics in multilayer capacitors are subjected to manufacturing or service thermomechanical stresses which, if severe enough, will cause mechanical failure and perhaps subsequent loss of electrical function. Strength of monolithic ceramics is probabilistic in nature; however, probabilistic design of such electronic ceramic components generally has not been used by manufacturers and end-users of these components. To illustrate how probabilistic design may be utilized for small components, the present study demonstrates the applicability of an existing probabilistic life design computer code in the prediction of failure probability of a dielectric ceramic in an arbitrary multilayer capacitor. Issues involving the generation of representative strength and fatigue data for specimens at this small scale and the ultimate failure probability prediction of dielectric ceramics in multilayer capacitors are presented. Additionally, alternative means to generate a strength distribution as input for the probabilistic life design computer codes which are under consideration by the authors are discussed.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Assistant Secretary for Energy Efficiency and Renewable Energy, Washington, DC (United States)
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 290938
- Report Number(s):
- ORNL/CP-98893; CONF-980521-; ON: DE99000366; BR: EE0402000; TRN: AHC29901%%143
- Resource Relation:
- Conference: 100. annual meeting of the American Ceramic Society, Cincinnati, OH (United States), 3-6 May 1998; Other Information: PBD: [1998]
- Country of Publication:
- United States
- Language:
- English
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