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Title: Stress level evaluation of thin films under thermal loading from a brazing process

Conference ·
OSTI ID:242697

X-ray front end beamline windows are made of thin beryllium foil that is commonly brazed or diffusion bonded onto a copper frame. In the brazing process, due to differences in the thermal expansion coefficient of the beryllium and copper materials, the beryllium film ends up in a state of very high level compression stress after cooling from 700{degrees}C (the brazing temperature) to room temperature. This makes the thin Be foil deform into a dome-shaped structure due to the usual asymmetrical geometry of the window. This paper studies the brazing process using a finite element method and explains the reason for such phenomena. Recommendations are offered for possible improvement in the bonding process of beryllium to the window block.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-31-109-ENG-38
OSTI ID:
242697
Report Number(s):
ANL/XFD/CP-89334; CONF-960706-18; ON: DE96011152
Resource Relation:
Conference: American Society of Mechanical Engineers (ASME) pressure vessels and piping conference, Montreal (Canada), 21-26 Jul 1996; Other Information: PBD: [1996]
Country of Publication:
United States
Language:
English