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Title: Study of Avalanche Behavior in 3 kV GaN Vertical P-N Diode under UIS Stress for Edge-Termination Optimization.

Conference ·

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Advanced Research Projects Agency - Energy (ARPA-E)
DOE Contract Number:
NA0003525
OSTI ID:
2003803
Report Number(s):
SAND2022-8684C; 707657
Resource Relation:
Conference: Proposed for presentation at the Proceedings of the 2022 IEEE International Reliability Physics Symposium (IRPS) held March 27-31, 2022 in Dallas, TX.
Country of Publication:
United States
Language:
English