Microfabricated ion trap chip with in situ radio-frequency sensing

Maunz, Peter Lukas Wilhelm; Blain, Matthew G.; Nordquist, Christopher

Title: Microfabricated ion trap chip with in situ radio-frequency sensing

Patent · Tue Jul 06 00:00:00 EDT 2021

OSTI ID:1840238

Maunz, Peter Lukas Wilhelm; Blain, Matthew G.; Nordquist, Christopher

A radio-frequency (RF) surface ion trap chip includes an RF electrode and an integrated capacitive voltage divider in which an intermediate voltage node is capacitively connected between the RF electrode and a ground. A sensor output trace is connected to the intermediate voltage node.

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Research Organization:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: NA0003525

Assignee:: National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)

Patent Number(s):: 11,056,332

Application Number:: 16/821,150

OSTI ID:: 1840238

Resource Relation:: Patent File Date: 03/17/2020

Country of Publication:: United States

Language:: English

References (20)

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