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Title: Convolutional neural networks for classification and labeling of defects on atomic scale silicon surfaces.

Conference ·
OSTI ID:1819255

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
1819255
Report Number(s):
SAND2020-9236D; 690334
Resource Relation:
Conference: Proposed for presentation at the Display at UT Austin, TX in Austin, TX.
Country of Publication:
United States
Language:
English