skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Doped gate dielectric materials

Abstract

A field effect transistor having at least a gate, source, and drain electrodes and a semiconductor channel for controlling transport of charge carriers between the source and drain electrodes, the gate being insulated from the channel by an dielectric, at least a portion of the dielectric disposed between the gate electrode and the semiconductor channel being doped or imbued with the an element which if doped or imbued into a semiconductor material would cause the semiconductor to be p-type. The p-type element used to dope or imbue the gate dielectric is preferably Mg.

Inventors:
; ;
Publication Date:
Research Org.:
HRL Labs., LLC, Malibu, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1805435
Patent Number(s):
10,903,333
Application Number:
15/663,584
Assignee:
HRL Laboratories, LLC (Malibu, CA)
DOE Contract Number:  
AR000450
Resource Type:
Patent
Resource Relation:
Patent File Date: 07/28/2017
Country of Publication:
United States
Language:
English

Citation Formats

Cao, Yu, Chu, Rongming, and Li, Zijian Ray. Doped gate dielectric materials. United States: N. p., 2021. Web.
Cao, Yu, Chu, Rongming, & Li, Zijian Ray. Doped gate dielectric materials. United States.
Cao, Yu, Chu, Rongming, and Li, Zijian Ray. 2021. "Doped gate dielectric materials". United States. https://www.osti.gov/servlets/purl/1805435.
@article{osti_1805435,
title = {Doped gate dielectric materials},
author = {Cao, Yu and Chu, Rongming and Li, Zijian Ray},
abstractNote = {A field effect transistor having at least a gate, source, and drain electrodes and a semiconductor channel for controlling transport of charge carriers between the source and drain electrodes, the gate being insulated from the channel by an dielectric, at least a portion of the dielectric disposed between the gate electrode and the semiconductor channel being doped or imbued with the an element which if doped or imbued into a semiconductor material would cause the semiconductor to be p-type. The p-type element used to dope or imbue the gate dielectric is preferably Mg.},
doi = {},
url = {https://www.osti.gov/biblio/1805435}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 26 00:00:00 EST 2021},
month = {Tue Jan 26 00:00:00 EST 2021}
}

Works referenced in this record:

Metal Oxide Semiconductor Thin Film Transistors
patent-application, January 2012


Method for Manufacturing Nitride Semiconductor Element
patent-application, November 2013


Semiconductor Device, Inverter Circuit, and Vehicle
patent-application, September 2016


Back Diffusion Suppression Structures
patent-application, October 2010


Germanium-Based Quantum Well Devices
patent-application, March 2016


III-Nitride Metal Insulator Semiconductor Field effect Transistor
patent-application, January 2013


Semiconductor Device and Method of Manufacturing the Same
patent-application, September 2016


Field Effect Transistor and Method of Manufacturing the Same
patent-application, January 2011