Characterization of high-purity germanium detectors with amorphous germanium contacts in cryogenic liquids

Panth, R.; Liu, J.; Abt, I.; Liu, X.; Schulz, O.; Wei, W. -Z.; Mei, H.; Mei, D. -M.; Wang, G. -J.

doi:10.1140/epjc/s10052-020-8235-9

Title: Characterization of high-purity germanium detectors with amorphous germanium contacts in cryogenic liquids

Journal Article · Fri Jul 24 00:00:00 EDT 2020 · European Physical Journal. C, Particles and Fields

DOI:https://doi.org/10.1140/epjc/s10052-020-8235-9· OSTI ID:1801602

Panth, R. ^[1];

^[1]; Abt, I. ^[2]; Liu, X. ^[2]; Schulz, O. ^[2]; Wei, W. -Z. ^[1]; Mei, H. ^[1]; Mei, D. -M. ^[1]; Wang, G. -J. ^[1]

Univ. of South Dakota, Vermillion, SD (United States)
Max Planck Inst. for Physik, Munich (Germany)

For the first time, planar high-purity germanium detectors with thin amorphous germanium contacts were successfully operated directly in liquid nitrogen and liquid argon in a cryostat at the Max-Planck-Institut für Physics in Munich. The detectors were fabricated at the Lawrence Berkeley National Laboratory and the University of South Dakota, using crystals grown at the University of South Dakota. They survived long-distance transportation and multiple thermal cycles in both cryogenic liquids and showed reasonable leakage currents and spectroscopic performance. Also discussed are the pros and cons of using thin amorphous semiconductor materials as an alternative contact technology in large-scale germanium experiments searching for physics beyond the Standard Model.

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Research Organization:: Univ. of South Dakota, Vermillion, SD (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: SC0004768; NSF OISE-1743790; PHYS-1902577; OIA-1738695

OSTI ID:: 1801602

Journal Information:: European Physical Journal. C, Particles and Fields, Vol. 80, Issue 7; ISSN 1434-6044

Publisher:: SpringerCopyright Statement

Country of Publication:: United States

Language:: English

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