A holistic view of crystalline silicon module reliability

Conference · Wed Nov 01 00:00:00 EST 1995

OSTI ID:175540

Hanoka, J I ^[1]

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1. Evergreen Solar, Inc., Waltham, MA (United States)

Several aspects of module reliability are discussed, particularly with reference to the encapsulant and its interaction with the metallization and interconnection of a module. A need to look at the module as a whole single unit is stressed. Also, the issue of a slight light degradation effect in crystalline silicon cells is discussed. A model for this is mentioned and it may well be that polycrystalline cells with dislocations may have an advantage.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• OSTI ID: 175540
• Report Number(s): NREL/CP-411-20379; CONF-9509187-; ON: DE96000468; TRN: 96:000710-0005
• Resource Relation: Conference: Workshop on photovoltaic performance and reliability, Golden, CO (United States), 7-8 Sep 1995; Other Information: PBD: Nov 1995; Related Information: Is Part Of Photovoltaic performance and reliability workshop; Mrig, L. [ed.]; PB: 361 p.
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
SILICON SOLAR CELLS
RELIABILITY
POTTING MATERIALS
PERFORMANCE
DISLOCATIONS
ENCAPSULATION
POLYMERS
ADHESION
OXIDATION