Dependence of CdTe response of bias history
- Colorado State Univ., Boulder, CO (United States)
Several time-dependent effect have been observed in CdTe cells and modules in recent years. Some appear to be related to degradation at the back contact, some to changes in temperature at the thin-film junction, and some to the bias history of the cell or module. Back-contact difficulties only occur in some cases, and the other two effects are reversible. Nevertheless, confusion in data interpretation can arise when these effects are not characterized. This confusion can be particularly acute when more than one time-dependent effect occurs during the same measurement cycle. The purpose of this presentation is to help categorize time-dependent effects in CdTe and other thin-film cells to elucidate those related to bias history, and to note differences between cell and module analysis.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- OSTI ID:
- 175537
- Report Number(s):
- NREL/CP-411-20379; CONF-9509187-; ON: DE96000468; TRN: 96:000710-0002
- Resource Relation:
- Conference: Workshop on photovoltaic performance and reliability, Golden, CO (United States), 7-8 Sep 1995; Other Information: PBD: Nov 1995; Related Information: Is Part Of Photovoltaic performance and reliability workshop; Mrig, L. [ed.]; PB: 361 p.
- Country of Publication:
- United States
- Language:
- English
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