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Title: Absolute measurement of the Fano factor using a Skipper-CCD

Journal Article · · TBD
OSTI ID:1682295

Skipper-CCD can achieve deep sub-electron readout noise making possible the absolute determination of the exact number of ionized electrons in a large range, from 0 to above 1900 electrons. In this work we present a novel technique that exploits this unique capability to allow self-calibration and the ultimate determination of silicon properties. We performed an absolute measurement of the variance and the mean number of the charge distribution produced by $$^{55}$$Fe X-rays, getting a Fano factor absolute measurement in Si at 123K and 5.9 keV. A value of 0.119 $$\pm$$ 0.002 was found and the electron-hole pair creation energy was determined to be (3.749 $$\pm$$ 0.001) eV. This technology opens the opportunity for direct measurements of the Fano factor at low energies.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1682295
Report Number(s):
arXiv:2004.11499; FERMILAB-PUB-20-283-E; oai:inspirehep.net:1792791
Journal Information:
TBD, Journal Name: TBD
Country of Publication:
United States
Language:
English