Dependence of polytetrafluoroethylene reflectance on thickness at visible and ultraviolet wavelengths in air
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this dependence in air for light of wavelengths 260 nm and 450 nm using two complementary methods. We find that PTFE reflectance for thicknesses from 5 mm to 10 mm ranges from 92.5% to 94.5% at 450 nm, and from 90.0% to 92.0% at 260 nm. We also see that the reflectance of PTFE of a given thickness can vary by as much as 2.7% within the same piece of material. Finally, we show that placing a specular reflector behind the PTFE can recover the loss of reflectance in the visible without introducing a specular component in the reflectance.
- Research Organization:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States); Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP)
- Contributing Organization:
- NEXT
- DOE Contract Number:
- AC02-07CH11359
- OSTI ID:
- 1647060
- Report Number(s):
- FERMILAB-PUB-20-385-ND-SCD; arXiv:2007.06626; oai:inspirehep.net:1806865
- Journal Information:
- TBD, Journal Name: TBD
- Country of Publication:
- United States
- Language:
- English
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