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Title: Data-driven Circuit Design From Electrical Measurement Data To Compact Device Models.

Conference ·
OSTI ID:1641510

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1641510
Report Number(s):
SAND2019-9190C; 678235
Resource Relation:
Conference: Proposed for presentation at the Machine Learning and Deep Learning Conference 2019 held August 6-7, 2019 in albuquerque, new mexico.
Country of Publication:
United States
Language:
English