Development of a time-to-digital converter ASIC for the upgrade of the ATLAS Monitored Drift Tube detector
Journal Article
·
· Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Univ. of Michigan, Ann Arbor, MI (United States)
- University of Science and Technology of China, Anhui (China); Univ. of Michigan, Ann Arbor, MI (United States)
- University of Science and Technology of China, Anhui (China)
The upgrade of the ATLAS muon spectrometer for the high-luminosity LHC requires new trigger and readout electronics for various elements of the detector. We present the design of a time-to-digital converter (TDC) ASIC prototype for the ATLAS Monitored Drift Tube (MDT) detector. The chip was fabricated in a GlobalFoundries 130 nm CMOS technology. Lastly, studies indicate that its timing and power dissipation characteristics meet the design specifications, with a timing bin variation of 40 ps for all 48 TDC slices and a power dissipation of about 6.5 mW per slice.
- Research Organization:
- Univ. of Michigan, Ann Arbor, MI (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP)
- Grant/Contract Number:
- SC0007859; SC0008062; AC02-98CH10886
- OSTI ID:
- 1638969
- Alternate ID(s):
- OSTI ID: 1549040
- Journal Information:
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 880, Issue C; ISSN 0168-9002
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 9 works
Citation information provided by
Web of Science
Web of Science
ATLAS Muon Drift Tube Electronics
|
journal | September 2008 |
FELIX: a High-Throughput Network Approach for Interfacing to Front End Electronics for ATLAS Upgrades
|
journal | December 2015 |
A radiation-hard PLL for frequency multiplication with programmable input clock and phase-selectable output signals in 130 nm CMOS
|
journal | December 2012 |
Full-speed testing of A/D converters
|
journal | December 1984 |
Interpolating time counter with 100 ps resolution on a single FPGA device
|
journal | January 2000 |
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