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Title: Grain boundary structure of two-dimensional tellurium revealed by 4D STEM

Technical Report ·
DOI:https://doi.org/10.2172/1630845· OSTI ID:1630845

The recent realization of 2D tellurium (tellurene) has allowed scientists to demonstrate an air-stable monoelemental van der Waals material with remarkable potential for applications in electronics and optoelectronics. The chiral-chain structure of ultrathin Te allows controllable electronic and optical properties due to the non-monotonic carrier mobility and an increase in electronic band-gap as the thickness is reduced. Scalable and accurate production of 2D Te-based functional devices will require detailed knowledge of structural defects and strain field distributions that can be linked to transport properties.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA); USDOE Laboratory Directed Research and Development (LDRD) Program
DOE Contract Number:
89233218CNA000001; 20190516ECR
OSTI ID:
1630845
Report Number(s):
LA-UR-20-23819
Country of Publication:
United States
Language:
English

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