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Title: Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

Journal Article · · J.Low Temp.Phys.
ORCiD logo [1];  [2];  [3];  [3];  [3];  [2];  [4];  [3];  [2];  [2];  [2];  [1];  [2];  [1];  [5]
  1. Stanford U., Phys. Dept.
  2. UC, Berkeley
  3. SLAC
  4. Fermilab
  5. Santa Clara U.
+ Show Author Affiliations

A model for charge trapping and impact ionization, and an experiment to measure these parameters is presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also describe. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.

Research Organization:
SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1617233
Report Number(s):
arXiv:1912.11549; FERMILAB-PUB-20-144-AE; oai:inspirehep.net:1773384
Journal Information:
J.Low Temp.Phys., Journal Name: J.Low Temp.Phys.
Country of Publication:
United States
Language:
English

References (12)

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First Dark Matter Constraints from a SuperCDMS Single-Charge Sensitive Detector journal August 2018
Energy-Resolved Measurements of the Phonon-Ionization of D − and A + Centers in Silicon with Superconducting-Al Tunnel Junctions journal November 1984
A method to define the energy threshold depending on noise level for rare event searches
  • Mancuso, M.; Bento, A.; Iachellini, N. Ferreiro
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 940 https://doi.org/10.1016/j.nima.2019.06.030
journal October 2019
Thermal detection of single e-h pairs in a biased silicon crystal detector text January 2017
First Dark Matter Constraints from a SuperCDMS Single-Charge Sensitive Detector text January 2018
Electronic structure of copper, silver, and gold impurities in silicon journal July 1985

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