Thickness and angular dependent ferromagnetic resonance of ultra-low damping Co25Fe75 epitaxial films

Cheng, Yang; Lee, Aidan J.; Brangham, Jack T.; White, Shane P.; Ruane, William T.; Hammel, P. Chris; Yang, Fengyuan

doi:10.1063/1.5055872

Title: Thickness and angular dependent ferromagnetic resonance of ultra-low damping Co₂₅Fe₇₅ epitaxial films

Journal Article · Thu Dec 27 00:00:00 EST 2018 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5055872· OSTI ID:1609473

Cheng, Yang ^[1]; Lee, Aidan J. ^[1]; Brangham, Jack T. ^[1]; White, Shane P. ^[1]; Ruane, William T. ^[1];

^[1]; Yang, Fengyuan ^[1]

The Ohio State Univ., Columbus, OH (United States)

Metallic ferromagnets with ultra-low damping are highly desirable for charge-based spintronic applications. In this work, we systematically investigate the magnetic dynamics of Co₂₅Fe₇₅ epitaxial films with a Gilbert damping constant as low as 7.1×10^-4. The in-plane angular dependence of ferromagnetic resonance (FMR) was measured on various thicknesses Co₂₅Fe₇₅ films grown on MgO and MgAl₂O₄, from which the mechanisms for FMR linewidth broadening can be distinguished and quantified. The thickness dependencies of the magnetic anisotropy and inhomogeneous broadening of the linewidth are good indicators of crystal quality and magnet uniformity. Additionally, it is shown that anisotropic two-magnon scattering is induced by defects at the surfaces.

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Research Organization:: The Ohio State Univ., Columbus, OH (United States)

Sponsoring Organization:: National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: FG02-03ER46054; DMR-1507274; DMR-1420451

OSTI ID:: 1609473

Journal Information:: Applied Physics Letters, Vol. 113, Issue 26; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 15 works

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