Three-Dimensional Shape Measuring Apparatus, Program, Computer-Readable Recording Medium, and Three-Dimensional Shape Measuring Method
|
patent-application
|
April 2007 |
Particle detection method and apparatus
|
patent
|
September 1988 |
System for automatic quality inspection of a printed image, comprising an image sensor, evaluation unit and display
|
patent
|
February 2010 |
Spectral irradiance model for tungsten halogen lamps in 340–850 nm wavelength range
|
journal
|
January 2010 |
Wide Angle Bistatic Scanning Optical Ranging Sensor
|
patent-application
|
March 2014 |
Coupling arrangement between a multi-mode light source and an optical fiber through an intermediate optical fiber length
|
patent
|
December 1999 |
Transparent Heat Shielding Multilayer Structure
|
patent-application
|
November 2009 |
Thin-film metrology using spectral reflectance with an intermediate in-line reference
|
patent
|
March 2009 |
Display device for cameras
|
patent
|
June 1988 |
Defect mapping system
|
patent
|
April 1995 |
Intelligent light source
|
patent
|
October 2002 |
Fuel cell
|
patent
|
March 2010 |
Measurement Apparatus, Exposure Apparatus, and Device Manufacturing Method
|
patent-application
|
October 2009 |
Batteries, Electrodes for Batteries, and Methods of Their Manufacture
|
patent-application
|
January 2008 |
Interferometer and Shape Measuring Method
|
patent-application
|
November 2006 |
Combinatorial Method and Apparatus for Screening Electrochemical Materials
|
patent-application
|
January 2006 |
Wafer characteristics via reflectometry
|
patent
|
October 2010 |
Combination Thin-Film Stress and Thickness Measurement Device
|
patent-application
|
November 2003 |
Apparatus For Measuring Defects In A Glass Sheet
|
patent-application
|
August 2008 |
Optical illumination and inspection system for wafer and solar cell defects
|
patent
|
August 1994 |
Automated Wafer Defect Inspection System and a Process of Performing Such Inspection
|
patent-application
|
September 2010 |
Apparatus for determining the effective surface roughness of polished optical samples by measuring the integral scattered radiation
|
patent
|
November 1990 |
Method and Apparatus for Using Multiple Relative Reflectance Measurements to Determine Properties of a Sample Using Vacuum Ultra Violet Wavelengths
|
patent-application
|
July 2010 |
Color-correcting exposure system for a photosensitive media
|
patent
|
May 1990 |
Fourier multispectral imaging
|
journal
|
August 2015 |
Review of automated visual inspection 1983-1993, Part I: conventional approaches
|
conference
|
August 1993 |
Optical system for forming an illuminated pattern on a material in motion and which illuminated pattern is synchronized with a detection device
|
patent
|
December 2009 |
Optical system for determining physical characteristics of a solar cell
|
patent
|
August 2001 |
Peripheral edge exposure method
|
patent
|
September 1998 |
Traversing thickness measurement apparatus and related method
|
patent
|
September 1998 |
Method for real-time in-line testing of semiconductor wafers
|
patent
|
November 2001 |
Apparatus and Method for Determining Service Life of Electrochemical Energy Sources Using Combined Ultrasonic and Electromagnetic Testing
|
patent-application
|
February 2008 |
Material composition analysis system and method
|
patent
|
April 2008 |
Automated Selection of X-Ray Reflectometry Measurement Locations
|
patent-application
|
November 2007 |
Apparatus and methods for the analytical determination of sample component concentrations that account for experimental error
|
patent
|
March 1998 |
Raman and photoluminescence spectroscopy
|
patent
|
April 2008 |
Carbon Nanotubes Based Nafion Composite Membranes for Fuel Cell Applications
|
journal
|
February 2010 |
Membrane electrode assemblies for use in fuel cells
|
patent
|
May 2007 |
Optical Inspection of Flat Media Using Direct Image Technology
|
patent-application
|
March 2008 |
Determining Parameters of the Dielectric Function of a Substance in Aqueous Solution by Self-Referenced Reflection THz Spectroscopy
|
patent-application
|
November 2010 |
Arrangement and method for inspection of surface quality
|
patent
|
December 2001 |
Method and apparatus for sensing or determining one or more properties or the identity of a sample
|
patent
|
December 1989 |
Device and method for testing a membrane electrode assembly
|
patent
|
September 2006 |
Method and apparatus for the measurement of cell size in a foam structure
|
patent
|
May 1982 |
Method and apparatus for detecting and locating perforations in membranes employed in electrochemical cells
|
patent
|
June 1998 |
Surface condition judging apparatus
|
patent
|
April 1986 |
A New Defect Etch for Polycrystalline Silicon
|
journal
|
January 1984 |
Method of making a gas diffusion media and quality controls for same
|
patent
|
October 2007 |
Adjustment Method, Substrate Processing Method, Substrate Processing Apparatus, Exposure Apparatus, Inspection Apparatus, Measurement and/or Inspection System, Processing Apparatus, Computer System, Program and Information Recording Medium
|
patent-application
|
May 2012 |
Automatic inspection apparatus and method for simultaneous detection of anomalies in a 3-dimensional translucent object
|
patent
|
March 2003 |
Optical Disc Apparatus, an Optical Disc Method, and a Semiconductor Integrated Circuit
|
patent-application
|
June 2005 |
Apparatus for inspecting wafers
|
patent
|
November 1989 |
Measuring apparatus for etching pits
|
patent
|
June 1989 |
Apparatus and method for providing uniform illumination of a sample plane
|
patent
|
December 1993 |
Method for detecting crystal defects in semiconductor silicon and detecting solution therefor
|
patent
|
January 1981 |
Visual Displacement Sensor
|
patent-application
|
October 2002 |
Thin-Film Inspection Apparatus and Inspection Method
|
patent-application
|
August 2011 |
Variable Electrostatic Spray Coating Apparatus and Method
|
patent-application
|
December 2002 |
Method and Apparatus for Measuring the Thickness of Films by Means of Elliptical Polarization of Reflected Infrared Radiation
|
patent
|
February 1969 |
Apparatus and methods for two-dimensional and three-dimensional inspection of a workpiece
|
patent-application
|
March 2008 |
Surface pit detection system and method
|
patent
|
December 1988 |
Method and its apparatus for inspecting particles or defects of a semiconductor device
|
patent-application
|
December 2005 |
Photovoltaic Devices in Tandem Architecture
|
patent-application
|
May 2009 |
Interferometer Device and Method
|
patent-application
|
May 2009 |
Method of inspecting microscopic surface defects
|
patent
|
May 1984 |
System and Method for Fuel Cell Material X-ray Analysis
|
patent-application
|
July 2008 |
Real-time in-line testing of semiconductor wafers
|
patent
|
June 2005 |
Apparatus and method for inspection of high component density printed circuit board
|
patent
|
October 1995 |
Method of media type differentiation in an imaging apparatus
|
patent
|
February 2006 |
Surface defect inspecting apparatus
|
patent
|
December 1986 |
Three-dimensional optical volume measurement for objects to be categorized
|
patent
|
April 2002 |
Two-phase optical inspection method and apparatus for defect detection
|
patent
|
December 1997 |
Interferometric Apparatus for Measuring Moving Object and Optical Interferometry Method for Measuring Moving Object
|
patent-application
|
January 2007 |
Multi-MEA test station and multi-MEA test method using the same
|
patent-application
|
August 2008 |
Method and Apparatus for Thin Film Quality Control
|
patent-application
|
April 2011 |
In Line Thickness Measurement
|
patent-application
|
January 2007 |
Non-contact optical techniques for measuring surface conditions
|
patent
|
February 1996 |
Method and Apparatus for Measuring Loading of Waterproofing Agent in Carbon Substrate
|
patent-application
|
February 2005 |
Adjustable feature access for a controlled environmental system
|
patent
|
April 2014 |
Determination of characteristics of material
|
patent
|
May 2000 |
Systems for Measuring Electro-Optic and Thermo-Optic Coefficients by Using Interference Fringe Measurement, and Methods of Measuring Electro-Optic and Thermo-Optic Coefficients by Using the Systems
|
patent-application
|
November 2010 |
Computer aided inspection machine
|
patent
|
May 2000 |
Method for detecting electrical defects in membrane electrode assemblies
|
patent
|
February 2007 |
On-Line, Continuous Monitoring in Solar Cell and Fuel Cell Manufacturing Using Spectral Reflectance Imaging
|
patent-application
|
July 2014 |
Apparatus for and a Method of Determining Surface Characteristics
|
patent-application
|
December 2009 |
Optical Member for Measuring Concentration, Concentration Measurement Unit Including the Optical Member, and Fuel Cell
|
patent-application
|
March 2007 |
Testing system for solar cells
|
patent
|
March 2010 |
Method and apparatus for performing highly accurate thin film measurements
|
patent
|
July 2008 |
Quality control methods for gas diffusion media
|
patent
|
February 2007 |
High resolution monitoring of CD variations
|
patent
|
July 2009 |
Method and Apparatus for Measuring Thickness of Thin Films Via Transient Thermoreflectance
|
patent-application
|
February 2007 |
Copying apparatus
|
patent
|
September 1986 |
Energy Management System and Method
|
patent-application
|
February 2011 |
Interferometric Endpoint Determination in a Substrate Etching Process
|
patent-application
|
June 2008 |
Apparatus for Characterization of Thin Film Properties and Method of Using the Same
|
patent-application
|
January 2010 |
Real-Time In-Line Testing of Semiconductor Wafers
|
patent-application
|
September 2005 |
Three-Dimensional Imaging Using a Fluorescent Medium
|
patent-application
|
January 2010 |
Apparatus and method for detecting longitudinally oriented flaws in a moving web
|
patent
|
December 1997 |
Optical Sensing System Based on a Micro-Array Structure
|
patent-application
|
July 2009 |
Three-Dimensional Shape Measuring Apparatus, Three-Dimensional Shape Measuring Method, Three-Dimensional Shape Measuring Program, and Recording Medium
|
patent-application
|
August 2010 |
Video inspection system employing multiple spectrum LED illumination
|
patent
|
November 1994 |
Optical Film Measuring Device
|
patent-application
|
November 2004 |
Automated wafer defect inspection system and a process of performing such inspection
|
patent
|
June 2010 |
Processing for the optical sorting of bulk material
|
patent
|
December 1996 |
Optical System for Measuring Samples Using Short Wavelength Radiation
|
patent-application
|
August 2004 |
Control system for multiple heating, ventilation and air conditioning units
|
patent
|
October 2010 |
Fuel Cell Evaluation Method And Fuel Cell Evaluation Apparatus
|
patent-application
|
June 2008 |
Method and apparatus for testing photovoltaic solar cells using multiple pulsed light sources
|
patent
|
November 2000 |
Use of optical scattering to characterize dislocations in semiconductors
|
journal
|
January 1988 |
Method and system for automated measurement of whole-wafer etch pit density in GaAs
|
patent
|
April 1991 |
Electro-optical inspection
|
patent
|
May 1992 |
Self referencing heterodyne reflectometer and method for implementing
|
patent
|
September 2009 |
Measuring the Shape and Thickness Variation of a Wafer with High Slopes
|
patent-application
|
November 2009 |
Optical system for measuring and inspecting partially transparent substrates
|
patent
|
May 2000 |
Method and device for simultaneously measuring multiple properties of multilayer films
|
patent
|
May 2002 |
Apparatus and Method for High-Speed Phase Shifting for Interferometric Measurement Systems
|
patent-application
|
December 2011 |
Radiation Image Storage Panel
|
patent-application
|
November 2002 |
Interferometers for the Measurement of Large Diameter Thin Wafers
|
patent-application
|
October 2007 |
Double sided optical inspection of thin film disks or wafers
|
patent
|
March 2007 |
Systems and Methods for Detecting and Indicating Fault Conditions in Electrochemical Cells
|
patent-application
|
November 2007 |
Method for Measuring Thin Films
|
patent-application
|
May 2007 |
Biochemical assay device using frustrated total internal reflection modulator with an imaging optical waveguide
|
patent
|
March 2004 |
Principle of a new reflectometer for measuring dielectric film thickness on substrates of arbitrary surface characteristics
|
journal
|
May 1988 |
Defect detecting device for two-layer parts, in particular for solar cells
|
patent
|
November 1994 |
Wafer characteristics via reflectometry and wafer processing apparatus and method
|
patent
|
July 2007 |
System for detecting unevenness degree of surface of semiconductor device
|
patent
|
August 1998 |
Applying infrared thermography as a quality-control tool for the rapid detection of polymer-electrolyte-membrane-fuel-cell catalyst-layer-thickness variations
|
journal
|
August 2012 |
Reflective type media sensing methodology
|
patent
|
May 2002 |
System for characterizing semiconductor materials and photovoltaic device
|
patent
|
December 1996 |
Image processing type of measuring device, lighting system for the same, lighting system control method, lighting system control program, and a recording medium with the lighting system control program recorded therein
|
patent
|
February 2007 |
Methods and Systems for Detecting Biological and Chemical Materials on a Submicron Structured Substrate
|
patent-application
|
November 2008 |
Fluorescent penetrant inspection sensor
|
patent
|
November 1990 |
Determination of thin film topography
|
patent
|
February 2007 |
Three-dimensional range camera
|
patent
|
August 1987 |
Optical Detection Systems and Methods of Making and Using the Same
|
patent-application
|
October 2011 |
Dynamic Metrology Sampling for a Dual Damascene Process
|
patent-application
|
October 2007 |
Non-Destructive Characterization Method, Especially for Characterizing Particles of Nuclear Fuel for a High-Temperature Reactor
|
patent-application
|
December 2009 |
Optical reflectance method for determining the surface roughness of materials in semiconductor processing
|
patent
|
April 1985 |
In Situ Optical Diagnostic for Monitoring or Control of Sodium Diffusion in Photovoltaics Manufacturing
|
patent-application
|
April 2014 |
Apparatus for measuring the color of a brilliant-cut diamond
|
patent
|
November 1984 |
Integrated sphere for diffusal reflectance and transmittance
|
patent
|
July 1996 |
System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface
|
patent
|
August 2004 |
High efficiency, low cost, thin film silicon solar cell design and method for making
|
patent
|
March 2001 |
Wafer inspection method and apparatus using diffracted light
|
patent
|
July 1998 |
Etch pit density measuring method
|
patent
|
May 1990 |
Fiber Optic Based In-situ Diagnostics For PEM Fuel Cells
|
patent-application
|
May 2008 |
Time-domain surface profile imaging via a hyperspectral Fourier transform spectrometer
|
journal
|
June 2008 |
Method and apparatus for manufacturing known good semiconductor die
|
patent
|
June 1997 |
Fuel Cell Diagnostic Apparatus and Diagnostic Method
|
patent-application
|
February 2008 |