Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy
Abstract
Development of ultrafast electron and X-ray scattering methods has enabled direct routes to probing atomic-scale structural dynamics. This in turn has led to new insight into lattice responses to a variety of dynamic processes associated with phase transformations, electron-lattice correlations, and nanoscale mechanical motion, to name a few. Presently, the most wide-spread approaches involve using table-top, laser-driven electron-scattering chambers or femtosecond (fs) X-ray beamlines to probe dynamics in reciprocal space and, in many instances, over specimen regions that are large relative to unit-cell dimensions and discrete (atomic and nanoscale) structural and morphological defects (e.g., vacancies, line and screw dislocations, grain boundaries, interfaces, etc.). As a result, the transients monitored for relatively large-spot-size reciprocal-space measurements – typically some aspect of a Bragg reflection (intensity, position, width, shape) – may be comprised of a range of responses occurring within the probed region. To directly resolve the role of distinct morphologies and structural features on dynamics associated with the nucleation, emergence, evolution, and decay of coherent phenomena, one would ideally directly image the local, nanoscale behaviors and precisely correlate responses to the nature of the feature. Here, I will show how such effects can be directly probed with ultrafast electron microscopy (UEM). Aftermore »
- Authors:
-
- Univ. of Minnesota, Minneapolis, MN (United States
- Publication Date:
- Research Org.:
- Univ. of Minnesota, Minneapolis, MN (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
- OSTI Identifier:
- 1595048
- Grant/Contract Number:
- SC0018204; DMR-1420013; DGE-1348264
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Microscopy and Microanalysis
- Additional Journal Information:
- Journal Volume: 24; Journal Issue: S1; Journal ID: ISSN 1431-9276
- Publisher:
- Microscopy Society of America (MSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION
Citation Formats
Flannigan, David J., Cremons, Daniel R., Du, Daniel X., McKenna, Alyssa J., and Plemmons, Dayne A. Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy. United States: N. p., 2018.
Web. doi:10.1017/S1431927618009674.
Flannigan, David J., Cremons, Daniel R., Du, Daniel X., McKenna, Alyssa J., & Plemmons, Dayne A. Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy. United States. https://doi.org/10.1017/S1431927618009674
Flannigan, David J., Cremons, Daniel R., Du, Daniel X., McKenna, Alyssa J., and Plemmons, Dayne A. 2018.
"Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy". United States. https://doi.org/10.1017/S1431927618009674. https://www.osti.gov/servlets/purl/1595048.
@article{osti_1595048,
title = {Imaging Coherent Structural Dynamics with Ultrafast Electron Microscopy},
author = {Flannigan, David J. and Cremons, Daniel R. and Du, Daniel X. and McKenna, Alyssa J. and Plemmons, Dayne A.},
abstractNote = {Development of ultrafast electron and X-ray scattering methods has enabled direct routes to probing atomic-scale structural dynamics. This in turn has led to new insight into lattice responses to a variety of dynamic processes associated with phase transformations, electron-lattice correlations, and nanoscale mechanical motion, to name a few. Presently, the most wide-spread approaches involve using table-top, laser-driven electron-scattering chambers or femtosecond (fs) X-ray beamlines to probe dynamics in reciprocal space and, in many instances, over specimen regions that are large relative to unit-cell dimensions and discrete (atomic and nanoscale) structural and morphological defects (e.g., vacancies, line and screw dislocations, grain boundaries, interfaces, etc.). As a result, the transients monitored for relatively large-spot-size reciprocal-space measurements – typically some aspect of a Bragg reflection (intensity, position, width, shape) – may be comprised of a range of responses occurring within the probed region. To directly resolve the role of distinct morphologies and structural features on dynamics associated with the nucleation, emergence, evolution, and decay of coherent phenomena, one would ideally directly image the local, nanoscale behaviors and precisely correlate responses to the nature of the feature. Here, I will show how such effects can be directly probed with ultrafast electron microscopy (UEM). After a brief overview of the operating principles of UEM, I will discuss how we are using real-space imaging to directly visualize coherent structural dynamics in a variety of nanostructured and nanoscale materials.},
doi = {10.1017/S1431927618009674},
url = {https://www.osti.gov/biblio/1595048},
journal = {Microscopy and Microanalysis},
issn = {1431-9276},
number = S1,
volume = 24,
place = {United States},
year = {Wed Aug 01 00:00:00 EDT 2018},
month = {Wed Aug 01 00:00:00 EDT 2018}
}
Works referenced in this record:
Probing Structural and Electronic Dynamics with Ultrafast Electron Microscopy
journal, April 2015
- Plemmons, Dayne A.; Suri, Pranav K.; Flannigan, David J.
- Chemistry of Materials, Vol. 27, Issue 9
4D Electron Microscopy: Principles and Applications
journal, August 2012
- Flannigan, David J.; Zewail, Ahmed H.
- Accounts of Chemical Research, Vol. 45, Issue 10
Ultrafast electron microscopy: Instrument response from the single-electron to high bunch-charge regimes
journal, September 2017
- Plemmons, Dayne A.; Flannigan, David J.
- Chemical Physics Letters, Vol. 683
Defect-mediated phonon dynamics in TaS 2 and WSe 2
journal, July 2017
- Cremons, Daniel R.; Plemmons, Dayne A.; Flannigan, David J.
- Structural Dynamics, Vol. 4, Issue 4
Visualization of Atomic-Scale Motions in Materials via Femtosecond X-Ray Scattering Techniques
journal, July 2017
- Lindenberg, Aaron M.; Johnson, Steven L.; Reis, David A.
- Annual Review of Materials Research, Vol. 47, Issue 1
Picosecond phase-velocity dispersion of hypersonic phonons imaged with ultrafast electron microscopy
journal, December 2017
- Cremons, Daniel R.; Du, Daniel X.; Flannigan, David J.
- Physical Review Materials, Vol. 1, Issue 7
Femtosecond electron imaging of defect-modulated phonon dynamics
journal, April 2016
- Cremons, Daniel R.; Plemmons, Dayne A.; Flannigan, David J.
- Nature Communications, Vol. 7, Issue 1
Spatiotemporal Evolution of Coherent Elastic Strain Waves in a Single MoS 2 Flake
journal, May 2017
- McKenna, Alyssa J.; Eliason, Jeffrey K.; Flannigan, David J.
- Nano Letters, Vol. 17, Issue 6
Femtosecond Crystallography with Ultrabright Electrons and X-rays: Capturing Chemistry in Action
journal, March 2014
- Miller, R. J. D.
- Science, Vol. 343, Issue 6175