Carrier lifetimes and interface recombination velocities in CdTe/MgxCd1– xTe double heterostructures with different Mg compositions grown by molecular beam epitaxy
- Arizona State Univ., Tempe, AZ (United States)
The interface recombination velocities of CdTe/MgxCd1–xTe double heterostructure (DH) samples with different CdTe layer thicknesses and Mg compositions are studied using time-resolved photoluminescence measurements. A lowest interface recombination velocity of 30 ± 10 cm/s has been measured for the CdTe/Mg0.46Cd0.54Te interface, and a longest carrier lifetime of 0.83 μs has been observed for the studied DHs. These values are very close to the best reported numbers for GaAs/AlGaAs DHs. As a result, the impact of carrier escape through thermionic emission over the MgCdTe barrier on the recombination process in the DHs is also studied.
- Research Organization:
- Stanford Univ., Stamfprd, CA (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- Grant/Contract Number:
- EE0004946; FA9550-12-1-0444
- OSTI ID:
- 1579851
- Journal Information:
- Applied Physics Letters, Vol. 107, Issue 4; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 17 works
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