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Title: Carrier lifetimes and interface recombination velocities in CdTe/MgxCd1– xTe double heterostructures with different Mg compositions grown by molecular beam epitaxy

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4927757· OSTI ID:1579851

The interface recombination velocities of CdTe/MgxCd1–xTe double heterostructure (DH) samples with different CdTe layer thicknesses and Mg compositions are studied using time-resolved photoluminescence measurements. A lowest interface recombination velocity of 30 ± 10 cm/s has been measured for the CdTe/Mg0.46Cd0.54Te interface, and a longest carrier lifetime of 0.83 μs has been observed for the studied DHs. These values are very close to the best reported numbers for GaAs/AlGaAs DHs. As a result, the impact of carrier escape through thermionic emission over the MgCdTe barrier on the recombination process in the DHs is also studied.

Research Organization:
Stanford Univ., Stamfprd, CA (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
Grant/Contract Number:
EE0004946; FA9550-12-1-0444
OSTI ID:
1579851
Journal Information:
Applied Physics Letters, Vol. 107, Issue 4; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 17 works
Citation information provided by
Web of Science

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Cited By (3)