X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3

Yan, Hui; Shirato, Nozomi; Zhu, Xiangde; Rosenmann, Daniel; Tong, Xiao; Xu, Weihe; Petrovic, Cedomir; Rose, Volker; Nazaretski, Evgeny

doi:10.3390/cryst9110588

Title: X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe₃

Journal Article · Sat Nov 09 00:00:00 EST 2019 · Crystals

DOI:https://doi.org/10.3390/cryst9110588· OSTI ID:1576223

Yan, Hui ^[1]; Shirato, Nozomi ^[2]; Zhu, Xiangde ^[3]; Rosenmann, Daniel ^[2]; Tong, Xiao ^[3]; Xu, Weihe ^[3]; Petrovic, Cedomir ^[3]; Rose, Volker ^[2];

^[3]

Univ. of Louisiana at Lafayette, Lafayette, LA (United States)
Argonne National Lab. (ANL), Argonne, IL (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)

Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized through excitation of core electrons by incident X-rays when their energy is tuned to an absorption edge of a particular atom during raster scanning, as is done in the conventional STM experiments. In this work, we provide a brief summary and the current status of SX-STM and discuss its applications for material science. In particular, we discuss instrumentation challenges associated with the SX-STM technique and present early experiments on Cu doped ZrTe3 single crystals.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: Brookhaven National Laboratory (BNL), Laboratory Directed Research and Development; USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division

Grant/Contract Number:: SC0012704; AC02-06CH11357

OSTI ID:: 1576223

Alternate ID(s):: OSTI ID: 1577254

Report Number(s):: BNL-212361-2019-JAAM; CRYSBC; TRN: US2001482

Journal Information:: Crystals, Vol. 9, Issue 11; ISSN 2073-4352

Publisher:: MDPICopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 4 works

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Title: X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3

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Title: X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe₃