Polarized pulsed front-end beam source for electron microscope

Patent · Tue Aug 11 00:00:00 EDT 2009

OSTI ID:1531595

Lewellen, John W.; Noonan, John

A method and an electron source are provided for generating polarized electrons for an electron microscope. The electron source includes a photoemissive cathode and a low-power drive laser. The geometry of the photoemissive cathode uses a generally planar emission surface, which is imaged to approximately 1/100 its initial size via electrostatic focusing elements. The virtual emitter, or image spot, then is used as an electron source by a conventional microscope column.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC02-06CH11357; W-31-109-ENG-38
• Assignee: UChicago Argonne, LLC (Chicago, IL)
• Patent Number(s): 7,573,053
• Application Number: 11/625,454
• OSTI ID: 1531595
• Resource Relation: Patent File Date: 2007-01-22
• Country of Publication: United States
• Language: English