Method for determining defect depth using thermal imaging

Sun, Jiangang

Title: Method for determining defect depth using thermal imaging

Patent · Tue Apr 01 00:00:00 EST 2003

OSTI ID:1531452

Sun, Jiangang

A method and apparatus are provided for determining the thickness of a sample and defect depth using thermal imaging in a variety of plastic, ceramic, metal and other products. A pair of flash lamps is positioned at a first side of the sample. An infrared camera is positioned near the first side of the sample. A data acquisition and processing computer is coupled to the flash lamps for triggering the flash lamps. The data acquisition and processing computer is coupled to the infrared camera for acquiring and processing thermal image data. The thermal image data are processed using a theoretical solution to analyze the thermal image data to determine the thickness of a sample and defect depth.

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Research Organization:: Univ. of Chicago, IL (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: W-31-109-ENG-38

Assignee:: The University of Chicago (Chicago, IL)

Patent Number(s):: 6,542,849

Application Number:: 09/766,214

OSTI ID:: 1531452

Resource Relation:: Patent File Date: 2001-01-19

Country of Publication:: United States

Language:: English

References (7)

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Transient defect detection algorithm Foes, Scott R.; Yazdi, Hamid https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7591583 US Patent Document 7,591,583	patent	September 2009
Method for producing a mirror substrate blank of titanium-doped silica glass for EUV lithography, and system for determining the position of defects in a blank Becker, Klaus https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/10016872 US Patent Document 10,016,872	patent	July 2018
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Methods and systems for measurement and estimation of normalized contrast in infrared thermography Koshti, Ajay M. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9787913 US Patent Document 9,787,913	patent	October 2017
Optical filter for flash lamps in pulsed thermal imaging Sun, Jiangang https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7538938 US Patent Document 7,538,938	patent	May 2009
Methods and systems for measurement and estimation of normalized contrast in infrared thermography Koshti, Ajay M. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9066028 US Patent Document 9,066,028	patent	June 2015
Thermal imaging method and apparatus for evaluating coatings Ringermacher, Harry Israel; Howard, Donald Robert; Knight, Bryon Edward https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8692887 US Patent Document 8,692,887	patent	April 2014
Thermal imaging method and apparatus Ouyang, Zhong; Smith, Kevin D. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7419298 US Patent Document 7,419,298	patent	September 2008
Method for thermal tomography of thermal effusivity from pulsed thermal imaging Sun, Jiangang https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7365330 US Patent Document 7,365,330	patent	April 2008
Method for analyzing multi-layer materials from one-sided pulsed thermal imaging Sun, Jiangang https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7769201 US Patent Document 7,769,201	patent	August 2010
Lamp assembly for a thermographic nondestructive evaluation system Howard, Donald Robert; Ringermacher, Harry Israel; Faidi, Waseem Ibrahim https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9500611 US Patent Document 9,500,611	patent	November 2016
Method for measuring thickness by pulsed infrared thermal wave technology Zeng, Zhi; Wang, Xun; Tao, Ning https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9464891 US Patent Document 9,464,891	patent	October 2016
Automatic detection of coating flaws Brinz, Thomas; Lewis, Jane; Tiefenbacher, Markus https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8000515 US Patent Document 8,000,515	patent	August 2011
Methods and systems for characterization of an anomaly using infrared flash thermography Koshti, Ajay M. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8577120 US Patent Document 8,577,120	patent	November 2013
Method and apparatus for determining structural damage depth, and method and apparatus for determining structural damage treatment Akashi, Yukio; Hashimoto, Kazuaki; Hayashi, Shogo https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8725430 US Patent Document 8,725,430	patent	May 2014

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