Effects of a long low-gap in-vacuum undulator on the impedance and beam lifetime
- Brookhaven National Lab. (BNL), Upton, NY (United States). Photon Sciences Directorate
Possible installation of a long low-gap in-vacuum undulator in the NSLS-II storage ring could result in several impedance-related and beam lifetime issues. High impedance of the low-gap undulator can result in beam instabilities and beam-induced overheating of the undulator itself. These issues have been preliminary studied using analytical formulae, computer simulations and experience of operations with existing in-vacuum undulators. Depending on the device location, the minimum gap and the overall ring-average residual gas pressure, an in-vacuum undulator (IVU) may appreciably shorten the elastic gas scattering component of the beam lifetime. When the latter becomes comparable to the Touschek lifetime, a significant reduction of the total beam lifetime will occur. Here this effect is studied by applying some well-known analytical formulas, as well as insights from NSLS-II operating experience. Finally, the issue of IVU radiation damage also needs to be looked at, and potentially addressed with a dedicated collimation system.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- DOE Contract Number:
- SC0012704
- OSTI ID:
- 1504719
- Report Number(s):
- NSLSII-ASD-TN-251; BNL-211195-2019-TECH
- Country of Publication:
- United States
- Language:
- English
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