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Title: Spatially Resolved Spectra from a new X-ray Imaging Crystal Spectrometer for Measurements of Ion and Electron Temperature Profiles

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1791747· OSTI ID:15014632

A new type of high-resolution X-ray imaging crystal spectrometer is being developed to measure ion and electron temperature profiles in tokamak plasmas. The instrument is particularly valuable for diagnosing plasmas with purely Ohmic heating and rf heating, since it does not require the injection of a neutral beam - although it can also be used for the diagnosis of neutral-beam heated plasmas. The spectrometer consists of a spherically bent quartz crystal and a two-dimensional position-sensitive detector. It records spectra of helium-like argon (or krypton) from multiple sightlines through the plasma and projects a de-magnified image of a large plasma cross-section onto the detector. The spatial resolution in the plasma is solely determined by the height of the crystal, its radius of curvature, and the Bragg angle. This new X-ray imaging crystal spectrometer may also be of interest for the diagnosis of ion temperature profiles in future large tokamaks, such as KSTAR and ITER, where the application of the presently used charge-exchange spectroscopy will be difficult, if the neutral beams do not penetrate to the plasma center. The paper presents the results from proof-of-principle experiments performed with a prototype instrument at Alcator C-Mod.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
15014632
Report Number(s):
UCRL-JRNL-206033; RSINAK; TRN: US0800884
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments; ISSN 0034-6748
Country of Publication:
United States
Language:
English

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