Spatial Coherence of Synchrotron Radiation
Synchrotron Radiation (SR) has been widely used since the 80's as a tool for many applications of UV, soft X rays and hard X rays in condensed matter physics, chemistry and biology. The evolution of SR sources towards higher brightness has led to the design of low-emittance electron storage rings (emittance is the product of beam size and divergence), and the development of special source magnetic structures, as undulators. This means that more and more photons are available on a narrow bandwidth and on a small collimated beam; in other words there is the possibility of getting a high power in a coherent beam. In most applications, a monochromator is used, and the temporal coherence of the light is given by the monochromator bandwidth. With smaller and smaller sources, even without the use of collimators, the spatial coherence of the light has become appreciable, first in the UV and soft X ray range, and then also with hard X rays. This has made possible new or improved experiments in interferometry, microscopy, holography, correlation spectroscopy, etc. In view of these recent possibilities and applications, it is useful to review some basic concepts about spatial coherence of SR, and its measurement and applications. In particular we show how the spatial coherence properties of the radiation in the far field can be calculated with simple operations from the single-electron amplitude and the electron beam angular and position spreads. The gaussian approximation will be studied in detail for a discussion of the properties of the far field mutual coherence and the estimate of the coherence widths, and the comparison with the VanCittert-Zernike limit.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 15014373
- Report Number(s):
- UCRL-JRNL-200688; TRN: US0802097
- Journal Information:
- Published in: Recent research developments in Optics, vol. 3, n/a, May 5, 2003, pp. 213-824, Vol. 3
- Country of Publication:
- United States
- Language:
- English
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