Photometric Calibration of an EUV Flat Field Spectrometer at the Advanced Light Source

May, M; Lepson, J; Beiersdorfer, P; Thorn, D; Chen, H; Hey, D; Smith, A

doi:10.1063/1.1535247

Title: Photometric Calibration of an EUV Flat Field Spectrometer at the Advanced Light Source

Conference · Wed Jul 03 00:00:00 EDT 2002

DOI:https://doi.org/10.1063/1.1535247· OSTI ID:15006156

May, M; Lepson, J; Beiersdorfer, P; Thorn, D; Chen, H; Hey, D; Smith, A

The photometric calibration of ail extreme ultraviolet flat field spectrometer has been done at the Advanced Light Source at LBNL. This spectrometer is used to record spectrum for atomic physics research from highly charged ions in plasmas created in the Livermore electron beam ion traps EBIT-I and SUPEREBIT. Two calibrations were done each with a different gold-coated grating, a 1200 {ell}/mm and a 2400 {ell}/mm, that covered 75-300{angstrom} and 15-160{angstrom}, respectively. The detector for this calibration was a back thinned CCD. The relative calibration was determined for several different incident angles for both gratings. Within the scatter of the data, the calibration was roughly insensitive to the incidence angle for the range of angles investigated.

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Research Organization:: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Sponsoring Organization:: US Department of Energy (US)

DOE Contract Number:: W-7405-ENG-48

OSTI ID:: 15006156

Report Number(s):: UCRL-JC-148357; TRN: US0400439

Resource Relation:: Journal Volume: 74; Journal Issue: 3; Conference: 14th Topical Conference on High Temperature Plasma Diagnostics, Madison, WI (US), 07/08/2002--07/11/2002; Other Information: PBD: 3 Jul 2002

Country of Publication:: United States

Language:: English

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Title: Photometric Calibration of an EUV Flat Field Spectrometer at the Advanced Light Source

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