Nanostructure of a-Si:H and Related Alloys by Small-Angle Scattering of Neutrons and X-Rays: Final Technical Progress Report, 22 May 1998 - 15 October 2001
This report describes work performed to provide details of the microstructure in high-quality hydrogenated amorphous and microcrystalline silicon and related alloys on the nanometer size scale. The materials studied were prepared by current state-of-the-art deposition methods as well as by new and emerging deposition techniques. The purpose is to establish the role of nanostructural features in controlling the opto-electronic and photovoltaic properties. The approach centered around the use of the uncommon technique of small-angle scattering of both x-rays (SAXS) and neutrons (SANS). SAXS has already been established as highly sensitive to microvoids and columnar-like microstructure. A major goal of this research was to establish the ability of SANS to detect hydrogen inhomogeneity in device-quality materials. This was demonstrated and new information on various materials have been provided. Conventional X-ray diffraction techniques were used to examine medium-range order and microcrystallinity, particularly near the boundary between amorphous and microcrystalline material.
- Research Organization:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC36-99-GO10337
- OSTI ID:
- 15000387
- Report Number(s):
- NREL/SR-520-31908; XAK-8-17619-31; TRN: US200325%%263
- Resource Relation:
- Other Information: PBD: 1 Mar 2002; Related Information: Work performed by Colorado School of Mines, Golden, Colorado
- Country of Publication:
- United States
- Language:
- English
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