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Title: Nanostructure of a-Si:H and Related Alloys by Small-Angle Scattering of Neutrons and X-Rays: Final Technical Progress Report, 22 May 1998 - 15 October 2001

Technical Report ·
DOI:https://doi.org/10.2172/15000387· OSTI ID:15000387

This report describes work performed to provide details of the microstructure in high-quality hydrogenated amorphous and microcrystalline silicon and related alloys on the nanometer size scale. The materials studied were prepared by current state-of-the-art deposition methods as well as by new and emerging deposition techniques. The purpose is to establish the role of nanostructural features in controlling the opto-electronic and photovoltaic properties. The approach centered around the use of the uncommon technique of small-angle scattering of both x-rays (SAXS) and neutrons (SANS). SAXS has already been established as highly sensitive to microvoids and columnar-like microstructure. A major goal of this research was to establish the ability of SANS to detect hydrogen inhomogeneity in device-quality materials. This was demonstrated and new information on various materials have been provided. Conventional X-ray diffraction techniques were used to examine medium-range order and microcrystallinity, particularly near the boundary between amorphous and microcrystalline material.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
AC36-99-GO10337
OSTI ID:
15000387
Report Number(s):
NREL/SR-520-31908; XAK-8-17619-31; TRN: US200325%%263
Resource Relation:
Other Information: PBD: 1 Mar 2002; Related Information: Work performed by Colorado School of Mines, Golden, Colorado
Country of Publication:
United States
Language:
English